The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2009

Filed:

Apr. 18, 2006
Applicants:

Seth S. Kessler, Waban, MA (US);

Christopher T. Dunn, Salem, MA (US);

Dong-jin Shim, Cohoes, NY (US);

Inventors:

Seth S. Kessler, Waban, MA (US);

Christopher T. Dunn, Salem, MA (US);

Dong-Jin Shim, Cohoes, NY (US);

Assignee:

Metis Design Corporation, Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01H 11/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting an event in a structure using a device having sensors and at least one actuator includes sending a signal from the at least one actuator encapsulated in the device, returning a reflected wave signal from the event to each of the sensors in the device, determining a respective duration of time for which the signal travels from the event to each of the sensors, and calculating a location of the event by using differences in the respective durations of time for which the signal travels from the event to each of the sensors to determine an angle and a distance at which the event is positioned.


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