The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Sep. 14, 2006
Applicants:

Anis M. Abdul, Austin, TX (US);

Ajay Kumar Mahajan, Austin, TX (US);

Victor Manuel Mena, Jr., Hutto, TX (US);

Inventors:

Anis M. Abdul, Austin, TX (US);

Ajay Kumar Mahajan, Austin, TX (US);

Victor Manuel Mena, Jr., Hutto, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and data processing system for isolating a faulty component in a computer. A first microcontroller detects a fault in a component of a computer. Responsive to detecting the fault, the first microcontroller sets a first fault record for the component to pending fault, sets a second fault record for the first microcontroller to pending fault, and fails over to a second microcontroller. If the second microcontroller detects the fault in the component of the computer, then the first fault record for the component is set to permanent fault, and the second fault record for the first microcontroller is cleared. If the second microcontroller determines the component of the computer does not have the fault, then the first fault record for the component is cleared, and the second fault record for the first microcontroller is set to permanent fault.


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