The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Jan. 20, 2004
Applicants:

David Eugene Huddleston, Lakewood, OH (US);

Yoh-han Pao, Cleveland Heights, OH (US);

Ronald Cass, Cleveland Heights, OH (US);

Qian Yang, Broadview Heights, OH (US);

Ella Polyak, Mayfield Heights, OH (US);

Peter Cryer, Mississauga, CA;

Charles Edward Garofalo, Brighton, MA (US);

Inventors:

David Eugene Huddleston, Lakewood, OH (US);

Yoh-Han Pao, Cleveland Heights, OH (US);

Ronald Cass, Cleveland Heights, OH (US);

Qian Yang, Broadview Heights, OH (US);

Ella Polyak, Mayfield Heights, OH (US);

Peter Cryer, Mississauga, CA;

Charles Edward Garofalo, Brighton, MA (US);

Assignee:

Computer Associates Think, Inc., Islandia, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06E 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An adaptive system modeling method is provided. A system model is generated by using data corresponding to an input features set selected by using a baseline significance signature of the system. A superset of the input features and other features also is selected by using the baseline significance signature. Data collected from the system corresponding to the superset is maintained online. A new significance signature of the system is periodically or intermittently determined by performing a discriminant analysis using the online superset data, and is used to detect an evolutionary change in the system.


Find Patent Forward Citations

Loading…