The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Aug. 09, 2004
Alexander I. Khibnik, Glastonbury, CT (US);
Mauro Jorge Atalla, South Glastonbury, CT (US);
Alan M. Finn, Hebron, CT (US);
Mark W. Davis, Southbury, CT (US);
Jun MA, Hamden, CT (US);
James Cycon, Media, PA (US);
Peter F. Horbury, Stratford, CT (US);
Andreas Bernhard, Shelton, CT (US);
Alexander I. Khibnik, Glastonbury, CT (US);
Mauro Jorge Atalla, South Glastonbury, CT (US);
Alan M. Finn, Hebron, CT (US);
Mark W. Davis, Southbury, CT (US);
Jun Ma, Hamden, CT (US);
James Cycon, Media, PA (US);
Peter F. Horbury, Stratford, CT (US);
Andreas Bernhard, Shelton, CT (US);
Sikorsky Aircraft Corporation, Stratford, CT (US);
Abstract
A method and system estimates a desired output signal waveform based on measured state parameters. A model training step generates a model by empirically obtaining measured signal waveforms corresponding to measured state parameters. Features, such as mode shapes and mode amplitudes, are extracted from the measured signals and stored in an estimation model along with coefficients of the model that correlate measured state parameters with the mode amplitudes. During part operation, the state parameters measured during operation are entered into the estimation model to obtain estimated features in a estimated signal waveform. The estimated features are then used to synthesize the estimated signal reflecting the actual operation of the operating part. The estimation model therefore allows estimation of an entire signal waveform from the state parameters.