The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Jun. 28, 2006
Applicants:

Dar-zu Hsu, Tainan County, TW;

San-liang Lee, Taipei, TW;

Inventors:

Dar-Zu Hsu, Tainan County, TW;

San-Liang Lee, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for measuring a coherence sampling quality-factor (Q-factor) are provided, which are used to monitor quality of an optical signal in an optical network in real time. The quality is evaluated by a Q-factor. A laser diode and a wavelength converter are used in the apparatus to achieve wavelength coherence and amplification of the optical signal. Furthermore, the laser diode and an optical switch are used together to obtain an optical pulse that can be utilized to sample the optical signal. Therefore, after entering into an optoelectronic converter, a baseband signal in the optical signal is reconstructed through the amplification of the optical signal and the coupling of the optical pulse, so as to detect the Q-factor and to monitor the quality of the optical signal.


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