The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Nov. 04, 2004
Applicants:
Kieran Gerard Larkin, Putney, AU;
Peter Alleine Fletcher, Rozelle, AU;
Inventors:
Kieran Gerard Larkin, Putney, AU;
Peter Alleine Fletcher, Rozelle, AU;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/00 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method () is disclosed for estimating an affine relation between a first image and a second image. The first and second images each have at least 4 non-parallel lines therein. The method () starts by identifying () sets of intersection points of the lines appearing in each of the images. The method () then determines () whether a relation between intersection points exists. If the relation exists then the first and second images are affine related and the affine distortion may be inverted ().