The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Jun. 05, 2002
Benoit Chauville, Paris, FR;
Frederic Guichard, Paris, FR;
Jean-marc Lavest, Clermont-Ferrand, FR;
Bruno Liege, Paris, FR;
Benoit Chauville, Paris, FR;
Frederic Guichard, Paris, FR;
Jean-Marc Lavest, Clermont-Ferrand, FR;
Bruno Liege, Paris, FR;
DO Labs, Boulogne, FR;
Abstract
A processing system and method for producing formatted information related to appliances of an appliance chain. This appliance chain includes at least one image-capture appliance and/or at least one image-restitution appliance for capturing and/or restituting an image on a medium. The system and method produce formatted information related to geometric distortions of at least one appliance of the chain. Fixed characteristics of the appliances and/or variable characteristics depending on the image can be taken into account. The fixed characteristics and/or the variable characteristics can be associated with one or more characteristic values, especially the focal length and/or the focusing. Then, measured formatted information related to the geometric distortions of the appliance are produced from a measured field. The system and method are applicable to photographic or video image processing, in optical devices, industrial controls, robotics, metrology, etc.