The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Feb. 17, 2005
Applicants:

Takashi Hashimoto, Saitama, JP;

Kurato Maeno, Saitama, JP;

Inventors:

Takashi Hashimoto, Saitama, JP;

Kurato Maeno, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A print medium quality adjustment system includes an inspection watermark medium output devicehaving an inspection watermark signal generation unitthat generates at least one inspection watermark signal, generates a watermark signal image by disposing the inspection watermark signal(s) in an arbitrary arrangement, and generates inspection training datahaving digitally recorded therein the inspection watermark signal(s). An inspection medium output unitprints the inspection watermark image onto a medium. A watermark quality inspection devicehas an output unitthat scans the printed medium, a signal detection unitthat extracts embedded watermark information, and a print quality judgment unitthat judges the watermark quality by comparing the extracted watermark information with the inspection training data. Based upon the quality judgment results, a print adjustment valueis generated to be used to improve the print quality.


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