The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Mar. 28, 2007
Applicants:

Yanfeng Du, Rexford, NY (US);

J. Eric Tkaczyk, Delanson, NY (US);

David M. Hoffman, New Berlin, WI (US);

Inventors:

Yanfeng Du, Rexford, NY (US);

J. Eric Tkaczyk, Delanson, NY (US);

David M. Hoffman, New Berlin, WI (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnostic imaging system includes a high frequency electromagnetic energy source that emits a beam of high frequency electromagnetic energy toward an object to be imaged. An energy discriminating (ED) detector receives high frequency electromagnetic energy emitted by the high frequency electromagnetic energy source. The ED detector includes a direct conversion layer dynamically operable in a photon counting mode in one view and in an integrating mode in another view and an indirect conversion layer. A data acquisition system (DAS) is operably connected to the ED detector and a computer operably connected to the DAS.


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