The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Apr. 25, 2005
Applicants:
Gerd Haeusler, Erlangen, DE;
Markus Knauer, Erlangen, DE;
Ralf Lampalzer, Rueckersdorf, DE;
Inventors:
Assignees:
3D-Shape GmbH, Erlangen, DE;
The University of Erlangen, Erlangen, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method teaches how to measure—even strongly curved—specular surfaces with an apparatus that measures a shape as well as local surface normals absolutely. This is achieved by the observation and evaluation of patterns that are reflected at the surface. The reflected patterns are observed from different directions. The evaluation is done by termination of those locations in space, where the surface normals that are observed from different directions, have at least deviations against each other.