The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Apr. 19, 2006
Applicants:

Mladen Gomercic, Braunschweig, DE;

Detlef Winter, Vordorf, DE;

Inventors:

Mladen Gomercic, Braunschweig, DE;

Detlef Winter, Vordorf, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A projector for an arrangement for three-dimensional optical measurement of objects () with the aid of a topometric measuring method in which images of projection patterns () projected onto an object () are acquired and evaluated, the projector having an illumination unit () and a carrier (), provided with projection patterns (), for projecting the light structures. The object is achieved by virtue of the fact that projection patterns () are arranged on the carrier () in the form of repeating geometrical individual structures, and the carrier () with the projection patterns () is movably arranged in such a way that during the movement and illumination selected regions of the projection pattern () are displaced into the beam path () between the illumination unit () and object (), and a stripe-shaped pattern is imaged on the object () by means of the movement unsharpness.


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