The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Sep. 19, 2005
Scott H. Bloom, Encinitas, CA (US);
John A. Adams, Escondido, CA (US);
Kristina M. Crousore, Oceanside, CA (US);
Alex Aguirre, San Diego, CA (US);
Michael Tutrow, Solana Beach, CA (US);
Brett A. Spivey, Carlsbad, CA (US);
Scott H. Bloom, Encinitas, CA (US);
John A. Adams, Escondido, CA (US);
Kristina M. Crousore, Oceanside, CA (US);
Alex Aguirre, San Diego, CA (US);
Michael Tutrow, Solana Beach, CA (US);
Brett A. Spivey, Carlsbad, CA (US);
JMAR Research, Inc., San Diego, CA (US);
Abstract
A particle detection system uses illumination incident at an angle to detect particles in a liquid such as water. By using illumination incident at an angle, the scattered light can be measured through a range of angles that are greater than the measured range of angles produced when the illumination is incident at a normal angle, when using the same detector. For example, the light can be measured through an angle that is twice that produced with illumination incident at a normal angle.