The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Oct. 23, 2007
Applicants:

Muqing Liu, Shanghai, CN;

Xiaoli Zhou, Shanghai, CN;

Wenyi LI, Shanghai, CN;

Wanlu Zhang, Shanghai, CN;

Chuan Yuan, Shanghai, CN;

Inventors:

Muqing Liu, Shanghai, CN;

Xiaoli Zhou, Shanghai, CN;

Wenyi Li, Shanghai, CN;

Wanlu Zhang, Shanghai, CN;

Chuan Yuan, Shanghai, CN;

Assignee:

Fu Dan University, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention belongs to the luminous flux measurement field, and especially relates to the equipment and method for LED's total luminous flux measurement with a narrow beam standard light source. The system for LED's total luminous flux measurement with a narrow beam standard light source in this invention comprises an integrating sphere, the light source, a narrow aperture fiber, a spectrometer and a driver for the light source. The light source is lighted by the driver. The narrow beam standard light source (both luminous flux standard and spectrum standard) is placed on the interior surface of integrating sphere, there is not any baffle in the sphere, and a narrow aperture fiber transfers the light to a multi-channel spectrometer which measures the spectrum distribution of LED and calculates its total luminous flux. The equipment in this invention is easy to use, has small error and low cost, and can achieve accurate results for LED's total luminous flux.


Find Patent Forward Citations

Loading…