The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Apr. 29, 2005
Applicants:

Takuya Chiba, Tokyo, JP;

Akira Hamano, Kanagawa, JP;

Kenji Tanaka, Tokyo, JP;

Inventors:

Takuya Chiba, Tokyo, JP;

Akira Hamano, Kanagawa, JP;

Kenji Tanaka, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A signal detection circuit and a controller receive signals from an imaging device, determine pixels having signal levels that exceed a predetermined defect determination level as defective pixels, and store the addresses of the defective pixels corresponding to read methods. When the imaging device images an object, a defect compensation circuit reads the addresses of the defective pixels that have been stored corresponding to the read methods and performs a predetermined compensation process for the defective pixels. A controller stores the signal levels of the defective pixels and converts the signal levels corresponding to the read methods. As a result, when defective pixels are detected in one read method, the defective pixels can be compensated in a plurality of read methods.


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