The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Jun. 13, 2005
Applicants:
Unal Murat Guruz, San Jose, CA (US);
Mary Kathryn Gutberlet, Prunedale, CA (US);
Douglas Johnson Werner, Fremont, CA (US);
Yvette Chung Nga Winton, San Francisco, CA (US);
Inventors:
Unal Murat Guruz, San Jose, CA (US);
Mary Kathryn Gutberlet, Prunedale, CA (US);
Douglas Johnson Werner, Fremont, CA (US);
Yvette Chung Nga Winton, San Francisco, CA (US);
Assignee:
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
Abstract
Both the wafer serial number and slider region location indicia on the wafer are formed on the front surface of the wafer using optical principles, i.e., without using a laser.