The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Oct. 03, 2005
Applicant:

Richard J. Tansey, Half Moon Bay, CA (US);

Inventor:

Richard J. Tansey, Half Moon Bay, CA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G01J 1/44 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectrum analyzer device is provided having an optical 'pixel' sensor array in a focal plane on a single chip, and a dedicated processor for each optical sensor that performs a pixel-based calculation of the power spectral density for the illumination captured by the optical sensor. Photoelectrons are maintained on the chip, thereby resulting in a significantly improved signal-to-noise ratio for the device. The device includes a sensor array having optical sensors arranged in a focal plane, where each optical sensor outputs a photon output signal upon receiving reflected illumination. The device also includes transform analysis units which receive the photon output signals from corresponding optical sensors and output power spectral density signals. Sampling circuits output the power spectral density signals from corresponding transform analysis units, and an array storage device receives the power spectral density signals from the sampling circuits and converts them to corresponding illumination intensity signals.


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