The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Jun. 05, 2006
Richard G. Paxman, Saline, MI (US);
John H. Seldin, Ann Arbor, MI (US);
Richard G. Paxman, Saline, MI (US);
John H. Seldin, Ann Arbor, MI (US);
General Dynamics Advanced Information Systems, Inc., Fairfax, VA (US);
Abstract
A system and method for imaging one or more objects in the presence of unknown phase and amplitude aberrations is described. Multiple images are collected so as to have measurement diversity and processed using a model-based approach to estimate the aberrations. An incoherent imaging model may be constructed to estimate the dependence of the imagery upon the object and the optical system, including the aberrations. A probability density function may then be calculated using the estimated model. Next, a maximum-likelihood estimate may be calculated and optimized, thus yielding a close approximation of the phase and amplitude aberrations. The estimates may then be used to estimate an image of the object or correct the system for future imaging.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile