The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2009
Filed:
Dec. 21, 2001
Andreas N. Dorsel, Menlo Park, CA (US);
Kyle J. Schleifer, Sunnyvale, CA (US);
Elecia C. White, San Jose, CA (US);
Charles S. Ladd, Union City, CA (US);
Debra A. Sillman, Santa Clara, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Kyle J. Schleifer, Sunnyvale, CA (US);
Elecia C. White, San Jose, CA (US);
Charles S. Ladd, Union City, CA (US);
Debra A. Sillman, Santa Clara, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method, apparatus for executing the method, and computer program products for use in such an apparatus. The method includes scanning an interrogating light across multiple sites on an array package including an addressable array of multiple features of different moieties, which scanned sites include multiple array features. Signals from respective scanned sites emitted in response to the interrogating light are detected. The interrogating light power is altered for a first site on the array package during the array scan, based on location of the first site or on a determination that the emitted signal from the first site will be outside a predetermined value absent the altering (which allows for protecting a detector against expected overly bright sites), or is altered during the array scan based on the detected interrogating light power (which allows for compensating for light source drift during an array scan).