The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Mar. 31, 2008
Method and system for detecting runtime defects in a program by comparing correct and incorrect runs
Yaakov Yaari, Haifa, IL;
Andre Heilper, Haifa, IL;
Yaakov Yaari, Haifa, IL;
Andre Heilper, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The invention provides an improved method and method for locating the origin of runtime defect in software programs. A differential debugging technique may be implemented to locate the diversion point where two programs start to behave differently. In one approach, the method generally involves running the two programs and generating respective control flow diagrams via a static code analyzer or the like. Tracer and supervisor modules may be used to replace addresses in registers with symbols and/or position-independent offsets, and to locate where differences in the register states occur.