The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

Dec. 12, 2003
Applicants:

Marc B. Dombrowa, Bronx, NY (US);

Dirk I. Hoenicke, Ossining, NY (US);

Ramendra K. Sahoo, Mohegan Lake, NY (US);

Krishnan Sugavanam, Mahopac, NY (US);

Inventors:

Marc B. Dombrowa, Bronx, NY (US);

Dirk I. Hoenicke, Ossining, NY (US);

Ramendra K. Sahoo, Mohegan Lake, NY (US);

Krishnan Sugavanam, Mahopac, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved method and apparatus for time stamping events occurring on a large scale distributed network uses a local counter associated with each processor of the distributed network. Each counter resets at the same time globally so that all events are recorded with respect to a particular time. The counter is stopped when a critical event is detected. The events are masked or filtered in an online or offline fashion to eliminate non-critical events from triggering a collection by the system monitor or service/host processor. The masking can be done dynamically through the use of an event history logger. The central system may poll the remote processor periodically to receive the accurate counter value from the local counter and device control register. Remedial action can be taken when conditional probability calculations performed on the historical information indicate that a critical event is about to occur.


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