The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

Oct. 03, 2005
Applicants:

Lei Zhang, Beijing, CN;

Mingju Zhang, Beijing, CN;

Wei-ying MA, Beijing, CN;

Yan-feng Sun, Beijing, CN;

Inventors:

Lei Zhang, Beijing, CN;

Mingju Zhang, Beijing, CN;

Wei-Ying Ma, Beijing, CN;

Yan-Feng Sun, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for cropping an image is provided. The cropping system automatically crops an image by selecting an image template whose condition is best satisfied by the image and then by selecting a cropping of the image that best attains the goal of the selected image template. The cropping system may use a metric or objective function to rate how well a cropping attains the goal of the selected image template. The cropping system may apply various optimization algorithms to identify a cropping that is the best as indicated by the metric. The cropping system can then automatically crop the image based on the identified cropping.


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