The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

Nov. 08, 2004
Applicants:

Petre Popescu, Ottawa, CA;

Douglas Stuart Mcpherson, Ottawa, CA;

Hai Tran Quoc, Ottawa, CA;

Stanislas Wolski, Montreal, CA;

Inventors:

Petre Popescu, Ottawa, CA;

Douglas Stuart McPherson, Ottawa, CA;

Hai Tran Quoc, Ottawa, CA;

Stanislas Wolski, Montreal, CA;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A clock and data recovery circuit (CDR) for receiving high-speed digital data, and having an analog phase offset control capability, is improved by providing an adaptive sampling edge position control. A differential circuit samples the raw data signal at three closely spaced sampling points of the eye, and compares advanced and delayed sampled data with the nominal sampled data. If either the advanced or delayed sampled data differ from the nominal sampled data, i.e. if advanced or delayed errors are detected, a shift in the sampling edge position may be required. A logic circuit performs a method determining the occurrence of advanced or delayed errors over progressively longer time intervals, and to adjust the sampling edge position of the CDR by controlling the phase offset.


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