The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

Dec. 07, 2004
Applicants:

Eyal Yardeni, Ardsley, NY (US);

Vasudeva Upadhya, New York, NY (US);

Inventors:

Eyal Yardeni, Ardsley, NY (US);

Vasudeva Upadhya, New York, NY (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G06F 15/16 (2006.01); G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for providing an adaptive monitoring process for distributed system containing a plurality of detected events, each of which is associated with at least one causing event. The method comprises the steps of receiving an indication of an occurrence of at least one detected event, enabling the detection of at least one second detected event, the second detected events associated with the detected events are nominally disabled, initiating at least one process for generating at least one second causing event associated with each of the enabled second detected events and identifying selected ones of the at least one second causing events based on the occurrence of at least one corresponding one of the second detected events.


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