The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

Jun. 06, 2003
Applicants:

Takuya Matsumoto, Hachiouji, JP;

Hideki Saga, Fuchu, JP;

Inventors:

Takuya Matsumoto, Hachiouji, JP;

Hideki Saga, Fuchu, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A near-field optical probe and optical near-field generator are provided. A problem of a probe having a scatterer in which optical near-field noises are generated at the parts other than for a point at which an intense optical near-field is generated, is solved. In one example of the probe, a surface of the parts except for a vertex of the scatterer at which the intense optical near-field is generated is etched so that an etching depth becomes not less than a penetration depth of the optical near-field. The probe facilitates control of noises when a sample is observed or recording marks are reproduced.


Find Patent Forward Citations

Loading…