The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7528774 B1

PDF
Full Text
Expired
Date of Patent:
May. 05, 2009

Filed:

Feb. 07, 2007
Applicants:

Wan Jin Kim, Yongin-si, KR;

Min Seop Jeong, Yongin-si, KR;

Jung Eun Lee, Yongin-si, KR;

Hee Mun Bang, Yongin-si, KR;

Inventors:

Wan Jin Kim, Yongin-si, KR;

Min Seop Jeong, Yongin-si, KR;

Jung Eun Lee, Yongin-si, KR;

Hee Mun Bang, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

An azimuth measurement apparatus including: a positioning signal receiver receiving a first impulse positioning signal and a second impulse positioning signal from a first fixed position and a second fixed position, respectively; a phase difference detector detecting a phase difference between the first impulse positioning signal and the second impulse positioning signal; and an azimuth calculator measuring an azimuth of an object of positioning, based on the detected phase difference of the two positioning signals.


Find Patent Forward Citations

Kim, Wan. (2009). Apparatus for measuring azimuth by using phase difference and method of using the same (U.S. Patent No. 7528774). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7528774

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