The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Aug. 17, 2006
Richard L. Rowe, Saratoga, CA (US);
Thomas W. Grudkowski, Pleasanton, CA (US);
Richard L. Rowe, Saratoga, CA (US);
Thomas W. Grudkowski, Pleasanton, CA (US);
SafeView, Inc., Los Gatos, CA (US);
Abstract
Methods for interrogating a subject with millimeter-wave electromagnetic radiation, and generating data representative of a selected feature of a subject may include serial comparative interrogating for processing. Serial processing may include first interrogating a given subject at a first time, generating a data set from the first interrogating, second interrogating the subject at a second time different than the first time, generating a data set from the second interrogating, and identifying information corresponding to a given feature of the subject from each data set. Non-serial processing may include interrogating a subject, generating a data set from the interrogating, identifying information corresponding to a first feature of the subject, and identifying information corresponding to a second feature of the subject. Processing may also include comparing the information identified, and/or rendering representations of the information identified and presenting the representations rendered.