The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Mar. 22, 2007
Charles H. Moore, Sierra City, CA (US);
Leslie O. Snively, Castle Rock, CO (US);
John Huie, Scottsdale, AZ (US);
Charles H. Moore, Sierra City, CA (US);
Leslie O. Snively, Castle Rock, CO (US);
John Huie, Scottsdale, AZ (US);
VNS Portfolio LLC, Cupertino, CA (US);
Abstract
An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using a different ADC for each sampling, wherein each sampling is sequentially offset a certain amount of time from the most recent preceding sampling. The samplings from the multitude of ADCs are combined to form a single contiguous digital output signal. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a specified permittivity material device, and a sequencer or multiplier.