The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

Sep. 20, 2005
Applicant:

Steven David Martinez, Albuquerque, NM (US);

Inventor:

Steven David Martinez, Albuquerque, NM (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A contactless precision, optical distance and angle measurement method and system optically measuring the position of a moveable object, the bending of the object, the torque applied to the object and the object's rotational velocity. The present invention includes a plurality of sectioned fiber optic placed around and adjacent to the moveable object that transmits optical signals to a surface of the object and receives the optic signals when a predefined marker or a reflective area is sensed. Another embodiment utilizes a sectioned optical assembly which, via alternate means, produces equivalent optical measurements. The received optic signals are then processed using mathematical computations that are facilitated through pre-characterization of the sensor response against a reflective material identical to that of the marker or reflective area.


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