The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2009

Filed:

May. 02, 2001
Applicants:

Robert Nakayama, Los Angeles, CA (US);

Richard Payne, Andover, MA (US);

Steven Sunshine, Pasadena, CA (US);

Beth Munoz, Vista, CA (US);

Jing LI, Temple City, CA (US);

Chang-meng Hsiung, Irvine, CA (US);

Inventors:

Robert Nakayama, Los Angeles, CA (US);

Richard Payne, Andover, MA (US);

Steven Sunshine, Pasadena, CA (US);

Beth Munoz, Vista, CA (US);

Jing Li, Temple City, CA (US);

Chang-Meng Hsiung, Irvine, CA (US);

Assignee:

Smiths Detection Inc., Pasadena, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 5/12 (2006.01); B05D 1/32 (2006.01); B05D 3/02 (2006.01); B05D 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides methods for fabricating a sensor on a substrate having a pair of electrodes. The methods are especially amenable to broad variations amongst individual sensor on a single substrate. The intra-sensor variation within the array can be achieved in various fashions. The method provide intra-sensor variation using quantitative and qualitative differences in each sensor.


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