The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2009
Filed:
Jun. 14, 2007
Tatsuo Yamaguchi, Tokyo, JP;
Toshifumi Mihashi, Tokyo, JP;
Tatsuo Yamaguchi, Tokyo, JP;
Toshifumi Mihashi, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A first wavelength for measurement is selected from among a plurality of wavelengths. Aberrations at the first wavelength are measured with a wavefront-measurement light source having the first wavelength. A compensation optical section performs compensation so as to cancel out the measured aberrations. After the compensation, a retinal image is obtained from a retina imaging device using a retina illumination light source having the same wavelength as the wavefront-measurement light source. During image-data transfer from the retina imaging device, aberrations at a second wavelength are measured using another wavefront-measurement light source having the second wavelength. The compensation optical section performs compensation so as to cancel out the measured aberrations. After the compensation, a retinal image is obtained using another retina illumination light source having the same wavelength as the another wavefront-measurement light source. A difference image is obtained from the retinal images, and displayed or stored.