The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

Feb. 14, 2005
Applicants:

James Lloyd, San Francisco, CA (US);

Faye Dai Hall, Santa Cruz, CA (US);

Michael Eynon, Santa Cruz, CA (US);

Abhinav Kumar, San Jose, CA (US);

Inventors:

James Lloyd, San Francisco, CA (US);

Faye Dai Hall, Santa Cruz, CA (US);

Michael Eynon, Santa Cruz, CA (US);

Abhinav Kumar, San Jose, CA (US);

Assignee:

eBay Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method to detect potential problems within a heterogeneous and diverse application environment. Operations data is received from a plurality of application servers within the application environment. The operations data pertains to operations performed at the plurality of application servers over a predetermined time interval. The operations data is aggregated. The aggregated data is compared to reference data, and a potential problem within the application environment is detected if the aggregated data deviates from the reference data in a predetermined manner.


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