The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
Dec. 29, 2004
Josh N. Hogan, Los Altos, CA (US);
Carol Jean Wilson, San Jose, CA (US);
Josh N. Hogan, Los Altos, CA (US);
Carol Jean Wilson, San Jose, CA (US);
Other;
Abstract
A non-invasive imaging and analysis system suitable for measuring concentrations of specific components, such as blood glucose concentration and suitable for non-invasive analysis of defects or malignant aspects of targets such as cancer in skin or human tissue, includes an optical processing system which generates a probe and composite reference beam. The system also includes a means that applies the probe beam to the target to be analyzed and modulates at least some of the components of the composite reference beam such that signals with different frequency content are generated. The system combines a scattered portion of the probe beam and the composite beam interferometrically to simultaneously acquire information from multiple depths within a target. It further includes electronic control and processing systems.