The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
Oct. 22, 2003
Kazunori Ban, Yamanashi, JP;
Ichiro Kanno, Yamanashi, JP;
Kazunori Ban, Yamanashi, JP;
Ichiro Kanno, Yamanashi, JP;
Fanuc Ltd, Yamanashi, JP;
Abstract
Slit light is projected onto the surface of an object, the reflected light is received using a video camera and analyzed by means of an image processor to thereby determine an equation of the surface onto which the slit light is projected. Then, an image is captured through normal image taking using the video camera and a straight line (line of sight) passing through the measuring point on the object and the center of the video camera is determined. Furthermore, parameters such as an affine transformation are determined by a comparison between the image of a characteristic area F of the object and a reference image. Then, the three-dimensional position and posture of the measuring point are determined from an intersection between the line of sight and the determined surface.