The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

May. 16, 2005
Applicants:

Hiromichi Atsuumi, Tokyo, JP;

Yasuo Yamanaka, Tokyo, JP;

Inventors:

Hiromichi Atsuumi, Tokyo, JP;

Yasuo Yamanaka, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning and imaging optical system that condenses beams of light deflected by an optical deflector toward a surface to be scanned to form a light spot for optical scanning on the surface includes plurality of scanning lenses. Among the scanning lenses, at least two of the scanning lenses are resin lenses that are formed by plastic molding, and where a position coordinate in a horizontal scanning direction or in a vertical scanning direction is X, refractive index distribution in a cross-section with respect to the position coordinate X is Δn(X), the refractive index distribution in a cross-section in the horizontal scanning direction that includes an optical axis or in the vertical scanning direction of the resin lenses, signs of the refractive index distribution Δn(X) at least in the vertical scanning direction are not identical for all of the resin lenses.


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