The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

May. 11, 2005
Applicant:

William Ernest Lee, Bristol, GB;

Inventor:

William Ernest Lee, Bristol, GB;

Assignee:

Renishaw PLC, Gloucestershire, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A polarising double-passed interferometer comprises a polarising beamsplitter (), a reference mirror () in the path of a reference beam () and a movable measurement mirror () in the path of a measurement beam (). The reference and measurement beams have different polarisations. An angular beam deflection device such a glass wedge or prism () acts to remove or separate out an error beam () caused by leakage of light of one polarisation into the path of light of the other polarisation.


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