The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
Mar. 23, 2007
Joachim Mannhardt, Eschach, DE;
Trevor Page, Hamshire, GB;
Martin Koch, Neuenburg, DE;
GEA Niro GmbH, , DE;
J&M Analytik AG, , DE;
Abstract
An apparatus for analyzing a product to be analyzed which is located in a receptacle provided with a coupling element, in particular for photometric or spectrophotometric analysis of powder, bulk material, granular material and similar, is provided with a docking element for sealing connection to the coupling element, and with a measuring probe which is arranged in a probe housing and is provided with at least one radiation and light measuring element, at least one measuring window, which is arranged in the beam path and is arranged in a wall of the probe housing, and with at least one detection element for the analysis. The probe housing with the measuring probe is designed and guided displaceably in such a way that at least a part of the probe housing in which the measuring window is located can be inserted into the receptacle for the analysis.