The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
Feb. 16, 2005
Andreas Mandelis, Toronto, Ontario, CA;
Alex Vitkin, Toronto, Ontario, CA;
Sergey Telenkov, Toronto, Ontario, CA;
Ying Fan, Toronto, Ontario, CA;
Andreas Mandelis, Toronto, Ontario, CA;
Alex Vitkin, Toronto, Ontario, CA;
Sergey Telenkov, Toronto, Ontario, CA;
Ying Fan, Toronto, Ontario, CA;
Other;
Abstract
A method and apparatus for biomedical subsurface imaging and measurement of thickness, elastic and optical properties of industrial and biomedical materials based on laser Photo-Thermo-Acoustic (PTA) frequency-swept heterodyne depth profilometry, In particular, the invention relates to biomedical imaging and measure of tissue and tumour thickness, L, speed of sound, c, acoustic attenuation coefficient, γ, optical absorption coefficient, μ, and optical scattering coefficient, μ. The method and apparatus involves providing for a sample of the material to be characterized; irradiating the material for a selected period of time with an excitation waveform from a modulated optical excitation source wherein a photo-thermo-acoustic emission is responsively emitted from said solid; detecting said emitted photo-thermo-acoustic emission; processing the electronic signal to convert the frequency-domain signal into time-domain and perform depth profilometric imaging and determining thermoelastic and optical properties of the material sample.