The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

Feb. 09, 2004
Applicants:

Tomoo Furukawa, Matsusaka, JP;

Makoto Shiomi, Tenri, JP;

Mitsuhiro Shigeta, Uji, JP;

Inventors:

Tomoo Furukawa, Matsusaka, JP;

Makoto Shiomi, Tenri, JP;

Mitsuhiro Shigeta, Uji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An evaluation apparatus of a liquid crystal display device in accordance with the present invention is provided with a signal section for supplying a signal to a liquid crystal panel to be evaluated; a display detection section for sensing a display state on the liquid crystal panel; an analysis section for analyzing a detection result of the display detection section. The signal section supplies to the liquid crystal panel a signal corresponding to an original tone and then, in accordance with tone transition from the original tone to an attainment tone, either (i) an overshoot test signal or (ii) both an overshoot test signal and an undershoot test signal in test driving, while sweeping either a level of the signal (i) or levels of both the signals (ii). The analysis section analyzes detection results of the display detection section obtained in the test driving and stores in association with the original tone and the attainment tone, a level of the test signal that corresponds to an optimum one of the detection results. With this, it is possible to easily and highly accurately obtain an optimum level of the overshoot signal or the undershoot signal for the liquid crystal panel to be evaluated.


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