The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
Oct. 26, 2006
Feng Zhang, Shanghai, CN;
Hongliang Chen, Shanghai, CN;
Fu Wang, Yueqing Zhejiang, CN;
Wusheng Chen, Yueqing Zhejiang, CN;
Yulin Zhang, Shanghai, CN;
Huaiyin Song, Yueqing Zhejiang, CN;
Feng Zhang, Shanghai, CN;
Hongliang Chen, Shanghai, CN;
Fu Wang, Yueqing Zhejiang, CN;
Wusheng Chen, Yueqing Zhejiang, CN;
Yulin Zhang, Shanghai, CN;
Huaiyin Song, Yueqing Zhejiang, CN;
General Protecht Group, Inc., Zhejiang, CN;
Abstract
An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism. In one embodiment, the apparatus includes a ground fault simulation circuit for generating a simulated ground fault during every negative half-wave of an AC power, a signature signal generating circuit for generating a signature signal reflecting the characteristic of the leakage current detection circuit and the trip mechanism, when the simulated ground fault is generated, and a life testing detection control circuit having a microcontroller and an alarm circuit. In operation, the life testing detection control circuit receives the signature signal from the signature signal generating circuit, analyzes the received signature signal to determine whether at least one fault exists in the leakage current detection circuit and the trip mechanism, and activates the alarm circuit if the at least one fault exists.