The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
May. 16, 2007
Applicants:
Hiroshi Ootaguro, Kanazawa, JP;
Yoshio Iwai, Kanazawa, JP;
Tetsuya Ohtomo, Kanazawa, JP;
Inventors:
Assignee:
Toshiba Matsushita Display Technology Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G02F 1/136 (2006.01);
U.S. Cl.
CPC ...
Abstract
An inspection circuit is constructed by first inspection TFTs provided to one end sides of signal lines, and second inspection TFTs provided to the other end sides of the signal lines. By using both the first inspection TFTs and the second inspection TFTs, the driving capability can be secured while miniaturizing the first inspection TFTs and the second inspection TFTs. Therefore, the signal lines can be reliably inspected while saving the space for the inspection circuit.