The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2009
Filed:
Jan. 16, 2007
Peter J. Hopper, San Jose, CA (US);
Kyuwoon Hwang, Palo Alto, CA (US);
Peter I. Smeys, Mountain View, CA (US);
Andrei Papou, San Jose, CA (US);
Peter J. Hopper, San Jose, CA (US);
Kyuwoon Hwang, Palo Alto, CA (US);
Peter I. Smeys, Mountain View, CA (US);
Andrei Papou, San Jose, CA (US);
National Semiconductor Corporation, Santa Clara, CA (US);
Abstract
A method for determining consistency of a permeability of a ferromagnetic material in integrated circuits in which a test strip of the subject ferromagnetic material is included for testing with an impedance measurement instrument, such as an inductance-capacitance-resistance (LCR) meter, with which the resistance of the strip of ferromagnetic material over a range of measurement signal frequencies is determined based upon the measured impedance values. The measured impedance values, measurement signal frequencies and selected permeability values are then used in numerical simulations to produce multiple resistance versus frequency curves each of which corresponds to one of the selected permeability values.