The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

Oct. 02, 2006
Applicants:

Philip D. Henshaw, Carlisle, MA (US);

Pierre C. Trepagnier, Medford, MA (US);

Inventors:

Philip D. Henshaw, Carlisle, MA (US);

Pierre C. Trepagnier, Medford, MA (US);

Assignee:

Sparta, Inc., Billerica, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention generally provides systems and methods for detection of agents of interest in a bulk quantity of matter, which also contains clutter and other constituents that typically interfere with the detection of one or more agents of interest. A detection system of the invention generally contains a collection subsystem for obtaining a bulk sample, an interrogation subsystem for generating one or more analytical signals representative of the composition of the bulk sample, and an analytical subsystem according to the teachings of the invention that implements the methods and algorithms of the invention for analyzing the sample analytical signals to determine whether one or more agents of interest are present, e.g., at quantities above a certain threshold, in the bulk sample.


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