The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

Nov. 26, 2003
Applicant:

Yoshiaki Mimura, Gamagori, JP;

Inventor:

Yoshiaki Mimura, Gamagori, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ophthalmic apparatus capable of performing smooth examination. The apparatus includes a chin rest on which a chin of an examinee is placed, a chin rest moving unit which puts the chin rest into up/down movement, an examination unit which has an examination optical system for examining an eye of the examinee, a first moving unit which puts the examination unit into up/down movement with respect to the eye, an alignment condition detection unit which detects an alignment condition of the examination unit with respect to the eye, and a control unit which drives and controls the chin rest moving unit based on at least any one of a possible range of the up/down movement and a limit position of the up/down movement of the examination unit as well as a detection result obtained by the alignment condition detection unit.


Find Patent Forward Citations

Loading…