The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

Dec. 20, 2006
Applicants:

Uma Srinivasan, Mountain View, CA (US);

Stephen David White, Santa Clara, CA (US);

Eric J. Shrader, Belmont, CA (US);

Steven E. Ready, Mountain View, CA (US);

Scott Jong Ho Limb, Palo Alto, CA (US);

Inventors:

Uma Srinivasan, Mountain View, CA (US);

Stephen David White, Santa Clara, CA (US);

Eric J. Shrader, Belmont, CA (US);

Steven E. Ready, Mountain View, CA (US);

Scott Jong Ho Limb, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of jet-printing smooth micro-scale features is presented. The desired feature prior to being printed is masked by various decimation filters and the decimation is performed at various pitches. The subsequently printed image is then scanned and analyzed to determine the roughness of the lines. The optimum decimation pitch is determined by the feature that exhibits the least amount of droplet spreading and has the lowest edge roughness. The optimum decimation pitch may also be calculated from the material properties and the dynamics of fluids.


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