The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2009

Filed:

May. 03, 2007
Applicants:

Yuki Okamoto, Hitachinaka, JP;

Shinya Igarashi, Naka, JP;

Chihiro Kobayashi, Naka, JP;

Masatomo Ide, Hitachinaka, JP;

Takeshi Morino, Hitachinaka, JP;

Inventors:

Yuki Okamoto, Hitachinaka, JP;

Shinya Igarashi, Naka, JP;

Chihiro Kobayashi, Naka, JP;

Masatomo Ide, Hitachinaka, JP;

Takeshi Morino, Hitachinaka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a thermal type flow rate measurement apparatus comprising a sub-passage having a detour passage and a hole just before a flow rate measuring part, for preventing its output value from falling onto a negative side when the flow rate is abruptly changed, a slit is formed downstream of a flow rate detecting element located after the detour passage. The slit hole may be arranged between the flow rate detecting element and the outlet port part, and may be opened between a wall surface side and a recess part. Thereby, it is possible to prevent the output value from falling in the negative side upon rise-up thereof.


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