The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Mar. 22, 2006
Alex Kass, Palo Alto, CA (US);
Christopher Cowell-shah, San Francisco, CA (US);
Neil Sheth, San Francisco, CA (US);
Lucian P Hughes, Half Moon Bay, CA (US);
Alex Kass, Palo Alto, CA (US);
Christopher Cowell-Shah, San Francisco, CA (US);
Neil Sheth, San Francisco, CA (US);
Lucian P Hughes, Half Moon Bay, CA (US);
Abstract
An event analysis system monitors information available from both publicly and privately distributed networks of information for events that are relevant to the user's particular business concerns. Those concerns are defined in a customized model of the user's organization and external business environment. The system receives the information, detects events in the information, interprets the events, and determines implications of these events. The detection and implication proceeds with regard to specific entities, relationships between entities, and definitions of the types of events which may occur in the environment in which the entities exist. Accordingly, the analysis system intelligently adapts its processing to recognize and report events which may be of interest for any particular entity.