The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
Sep. 30, 2005
Mark Alan Peot, Irmo, SC (US);
Mario Aguilar, Cary, NC (US);
Mark Alan Peot, Irmo, SC (US);
Mario Aguilar, Cary, NC (US);
Rockwell Scientific Licensing, LLC, Thousand Oaks, CA (US);
Abstract
Bayesian super-resolution techniques fuse multiple low resolution images (possibly from multiple bands) to infer a higher resolution image. The super-resolution and fusion concepts are portable to a wide variety of sensors and environmental models. The procedure is model-based inference of super-resolved information. In this approach, both the point spread function of the sub-sampling process and the multi-frame registration parameters are optimized simultaneously in order to infer an optimal estimate of the super-resolved imagery. The procedure involves a significant number of improvements, among them, more accurate likelihood estimates and a more accurate, efficient, and stable optimization procedure.