The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Apr. 06, 2004
Applicant:

Mark Kantrowitz, Pittsburgh, PA (US);

Inventor:

Mark Kantrowitz, Pittsburgh, PA (US);

Assignee:

MK Consulting, Inc., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01); G06Q 50/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining an optimized surveillance schedule of follow-up diagnostic tests and doctor visits considers the tradeoff between timely detection of relapse and the cost of the diagnostic procedures. Determining subsequent testing dates for detection of a disease includes the steps of: a.) choosing a surveillance schedule, wherein the surveillance schedule includes a plurality of time segments for which a corresponding test is scheduled, wherein the first surveillance schedule has associated therewith a plurality of probabilities representing the probabilities that relapse will be detected in the corresponding plurality of time segments of the surveillance schedule; b.) determining a solution for an equation and c.) delaying each subsequent testing date until the cost per detected relapse is below a probability threshold of C/T.


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