The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2009
Filed:
May. 30, 2007
Lei LI, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Pei-qi LI, Shenzhen, CN;
Zhi-li Chen, Shenzhen, CN;
Yun-fang Zhao, Shenzhen, CN;
Hong-yu Pan, Shenzhen, CN;
Lei Li, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Pei-Qi Li, Shenzhen, CN;
Zhi-Li Chen, Shenzhen, CN;
Yun-Fang Zhao, Shenzhen, CN;
Hong-Yu Pan, Shenzhen, CN;
ShenZhen Fataihong Precision Industry Co., ltd., ShenZhen, Guangdong Province, CN;
Sutech Trading Limited, Tortola, VG;
Abstract
An assessment system () used to creating an assessment of workpieces includes a database module (), a connecting module (), and a server module (). The database module stores computer aided design (CAD) drawings of the checked workpieces. The database module and the server module are connected to each other via the connecting module. The server module is connected to the database module and includes an inquiry module and a processor module. The inquiry module inquires the CAD drawings of each checked workpiece and acquires relational parameters of the checked workpieces from the CAD drawings. The processor module processes the parameters acquired by the inquiry module, and the server module creates an assessment according to the parameters and data processed by the processor module.