The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2009

Filed:

Mar. 10, 2008
Applicants:

Yohichi Miwa, Yokohama, JP;

Aya Minami, Fujisawa, JP;

Toshiyuki Sanuki, Kanagawa, JP;

Inventors:

Yohichi Miwa, Yokohama, JP;

Aya Minami, Fujisawa, JP;

Toshiyuki Sanuki, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This is an embodiment for enabling calibration of the bus interfacing cell processors and I/O Controllers in a multi-cell system without rebooting the system in response to a change in the environment temperature. This is accomplished by periodically checking the intake temperature. If the temperature rise is less than a predefined threshold, no action is taken. If the temperature rise is more than a predefined threshold, external interfaces are disabled, cell operations are halted and calibration is performed. Once the calibration is completed, cell operations are resumed and external interfaces are re-enabled.


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